Quantity or scope
One high quality spectrophotometer covering the ultraviolet (UV), visible (VIS) and near-infrared (NIR) parts of the electromagnetic spectrum. High quality optical design is quintessential, which is reflected in the stringent technical requirements. The instrument is to be used by a large user base, so a user-friendly and powerful software package has to be included in the offer. Further, a set of tools for various different sample measurements is included.Technical Requirements- Wavelength range: 175-3300nm- Limiting resolution: UV-VIS <0.05 nm, NIR <0.5nm- Stray light (%T)o @ 220nm (10 g/L NaI) ≤0.00007%o @ 2365nm (CHCl3, 1cm path length) ≤0.0005%- Wavelength accuracyo UV-VIS (190–900nm) ≤0.08nmo NIR (760–3000nm) ≤0.4nm- Wavelength reproducibility (nm)o Peak separation of repetitive scanning of a line sourceUV-VIS ≤0.02nmNIR ≤0.08nmo Standard deviation of 10 measurementsUV-VIS ≤0.005nmNIR ≤0.02nm- Photometric accuracy (Abs) using double aperture method at 0.3Abs UV-VIS< 0.00025Abs- Photometric linearity (Abs) (filter addition method)o UV-Vis, at 1Abs ≤0.006 Abso UV-Vis, at 2Abs ≤ 0.017 Abso UV-Vis, at 3Abs ≤ 0.02 Abso NIR, at 1Abs ≤ 0.0015Abso NIR, at 2Abs ≤ 0.007Abs- Photometric range (Abs) ≥8 Abs UV-VIS, ≥6 Abs NIR- Baseline flatness (Abs) for specified integration time and spectral bandwidtho baseline corrected ≤0.008 (200 to 3000 nm)o no smoothing applied ≤0.008 (200 to 3000 nm)- Photometric reproducibility (Abs) using certified filters for specified integration time, spectral bandwidth, expressed in standard deviation for a specified number of measurementso @0.5Abs ≤0.00008o @1.0Abs ≤0.00016- Photometric stability after lamp warm up, 500nm, for specified integration time and spectral bandwidth≤0.0002Abs/hour- Spectral bandwidtho UV-VIS 0.01–5.00nm, 0.01 nm stepso NIR 0.04–20 nm- Computer for instrument controlSoftware Requirements- Absorbance and transmittance readings- Base line correction- Data acquisition modes: simple read, scan, kinetics and polarization- Software-enabled accessory control (temperature, polarizer, integrating sphere)- Software scriptingSample Specific Requirements- Temperature controlled cuvette sample holder (0-100 °C) with integrated stirrer.- Easy to plug-in accessory for diffuse reflectance measurements on bulk solids, films and powders. Wavelength range = 200-2500 nm. Sphere diameter ≥60 mm- Polarization optics- Variable angle sample holder for specular reflectance- Brewster angle sample holder55 000